The FEIS-3 international workshop is the third in a series with the first held in Key West (Florida, USA), 2013, and the second in East Lansing (Michigan, USA), 2015. The upcoming FEIS-3, organized by Shanghai Jiao Tong University, will be held in Shanghai, China, June 11-15, 2017.  FEIS-3 will be dedicated to the Legacy of Professor Ahmed Zewail.

Over the past few years the field using pulsed electrons (with energy ranging from meV to MeV) as probes to study ultrafast dynamics has advanced rapidly. Visualizing the optically-created out-of-equilibrium states of matter with Femtosecond Electron Imaging and Spectroscopy (FEIS) has become the tool of choice to solve the grand challenges in capturing the ultrafast while probing the ultrasmall.

This workshop brings together different research groups working on instruments development and the related applications of FEIS. One particular goal is to promote close interactions and cooperation between the instrument development scientists and users in this area. Workshop Themes include, but not limited to:
  • Instrument development (ultrafast electron diffraction and imaging systems, etc.)
  • Ultrafast dynamics in strongly correlated materials
  • Ultrafast processes in magnets
  • Ultrafast molecular dynamics
  • Applications in biology and chemistry
  • Complementary techniques: FEL, tr-ARPES, LIED, ultrafast spectroscopy
  • Selective excitation with THz pump
  • Applications of ultrafast electron microscope (single shot and 4D EM)
  • Sample preparation techniques
  • Electron optics and aberrations associated with high-intensity beams
  • Advanced concepts (e.g. pushing resolution to 10 fs and beyond)

We look forward to your participation in FEIS-3. Thank you!

  • Sincerely yours,
  • Dr. Jie Zhang (SJTU), Workshop Chair
  • Dr. Yimei Zhu (BNL), Scientific Program Committee Chair
  • Dr. Dao Xiang (SJTU), Local Organizing Committee Chair

CopyRight 2016-2017 || The 3rd Femtosecond Electron Imaging and Spectroscopy Workshop, June 11-15, 2017, Shanghai, China ||